Crosstalk noise reduction in synthesized digital logic circuits
نویسندگان
چکیده
As CMOS technology scales into the deep submicrometer regime, digital noise is becoming a metric of importance comparable to area, timing, and power, for analysis and design of CMOS VLSI systems. Noise has two detrimental effects in digital circuits: First, it can destroy logical information carried by a circuit net. Second, it causes delay uncertainty: Noncritical paths might become critical because of noise. As a result, circuit speed becomes limited by noise, primarily because of capacitive coupling between wires. Most design approaches address the crosstalk noise problem at the layout generation stage, or via postlayout corrections. With continued scaling, too many circuit nets require corrections for noise, causing a design convergence problem. This work suggests to consider noise at the gate-level netlist generation stage. The paper presents a simplified analysis of on-chip crosstalk models, and demonstrates the significance of crosstalk between local wires within synthesized circuit blocks. A design flow is proposed for automatically synthesizing CMOS circuits that have improved robustness to noise effects, using standard tools, by limiting the range of gate strengths available in the cell library. The synthesized circuits incur a penalty in area/power, which can be partially recovered in a single postlayout corrective iteration. Results of design experiments indicate that delay uncertainty is the most important noise-related concern in synthesized static CMOS logic. Using a standard synthesis methodology, critical path delay differences up to 18% of the clock cycle time have been observed in functional blocks of microprocessor circuits. By using the proposed design flow, timing uncertainty was reduced to below 3%, with area and power penalties below 20%.
منابع مشابه
A Minimal-Cost Inherent-Feedback Approach for Low-Power MRF-Based Logic Gates
The Markov random field (MRF) theory has been accepted as a highly effective framework for designing noise-tolerant nanometer digital VLSI circuits. In MRF-based design, proper feedback lines are used to control noise and keep the circuits in their valid states. However, this methodology has encountered two major problems that have limited the application of highly noise immune MRF-based circui...
متن کاملA Design Methodology for Reliable MRF-Based Logic Gates
Probabilistic-based methods have been used for designing noise tolerant circuits recently. In these methods, however, there is not any reliability mechanism that is essential for nanometer digital VLSI circuits. In this paper, we propose a novel method for designing reliable probabilistic-based logic gates. The advantage of the proposed method in comparison with previous probabilistic-based met...
متن کاملModeling and Simulation of Substrate Noise in Mixed-Signal Circuits Applied to a Special VCO
The mixed-signal circuits with both analog and digital blocks on a single chip have wide applications in communication and RF circuits. Integrating these two blocks can cause serious problems especially in applications requiring fast digital circuits and high performance analog blocks. Fast switching in digital blocks generates a noise which can be introduced to analog circuits by the common su...
متن کاملSubstrate Noise Reduction in CMOS Transistors: a methodology definition
Substrate coupling can corrupt low level analog signals and impair the performance of monolithic integrated circuits. Therefore, a characterization methodology able to evaluate the efficiency of the countermeasures against crosstalk, appears very important for designers. In this paper, after the verification that PMOS transistors are more sensitive to substrate voltage fluctuations than NMOS on...
متن کاملTimed Test Generation Crosstalk Switch Failures in Domino CMOS Circuits
As technology scales into the deep submicron regime, capacitive coupling between signal lines becomes a dominant problem. Capacitive coupling is more acute for domino logic circuits since an irreversible, unwanted gate output transition can result. We present a timed test generation methodology for CMOS domino circuits that assigns the circuit inputs so that capacitively-coupled aggressors of a...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- IEEE Trans. VLSI Syst.
دوره 11 شماره
صفحات -
تاریخ انتشار 2003